The use of Scanning Electron Microscopes and X-ray Spectrometers for the Identification of Hafting Traces and other Residues
This resource is a citation record only, the Center for Digital Antiquity does not have a copy of this document. The information in this record has been migrated into tDAR from the EXARC Bibliography, originally compiled by Roeland Paardekooper, and updated. Most of these records consist of a document citation and other metadata but do not have the documents themselves uploaded.
If you have a digital copy of the document and would like to have it curated in tDAR, please contact us using the "Submit Correction, Comment" link to the right.
Cite this Record
The use of Scanning Electron Microscopes and X-ray Spectrometers for the Identification of Hafting Traces and other Residues. Alfred F Pawlik, E A Walker, F Wenban-Smith, F Healy. In Lithics in Action: papers from the conference Lithic Studies in the Year 2000. Pp. xx-xx. Oxford: Oxbow Books. 2003 ( tDAR id: 418883)
This Resource is Part of the Following Collections
Use Wear Analysis
Individual & Institutional Roles
ExArc Id(s): 5138
Rights & Attribution: The information in this record was originally compiled by Dr. Roeland Paardekooper, EXARC Director.