SIMS (Other Keyword)

DOCUMENT Citation Only Mostafa Fayek. Brooke Milne. Ryan Sharpe. Rachel ten Bruggencate. Lawrence Anovitz.

Obsidian hydration dating (OHD) is based on the premise that when an obsidian artifact is manufactured, the fresh surface exposed immediately begins to hydrate. A state-of-the-art obsidian hydration dating technique utilizes secondary ion mass spectrometry (SIMS) to measure H diffusion profiles in obsidian artifacts and the depths of the resulting sputter pits by a stylus-type profilometer. The pit depths are matched with the SIMS H diffusion profiles, which are compared to diffusion profiles of...