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DOCUMENT Citation Only Kele Missal.

Use-wear analysts use various methods of imaging in order to identify patches of wear on stone tool surfaces. Obsidian, however, creates several imaging roadblocks for use-wear analysts who often depend upon light microscopy for their analyses. The integration of scanning electron microscopy (SEM) has allowed use-wear analysts to derive better image results from obsidian objects as it removes interference from color, surface reflectivity, and transparency. Yet SEM also has several drawbacks for...