Application of Proton-Induced X-Ray Emission To Quantitive Trace Element Analysis

Author(s): H. Kaji; T. Shiokawa; K. Ishii; S. Morita; M. Kamiya; K. Sera; H. Twara

Year: 1977

Summary

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Cite this Record

Application of Proton-Induced X-Ray Emission To Quantitive Trace Element Analysis. H. Kaji, T. Shiokawa, K. Ishii, S. Morita, M. Kamiya, K. Sera, H. Twara. Report ,1. US: Nuclear Instruments and Methods. 1977 ( tDAR id: 165924)

This Resource is Part of the Following Collections

Keywords

Investigation Types
Archaeological Overview

General
Methodology • Pixe Analysis • Trace Elements

Geographic Keywords
12998 (Fips Code) • Florida (State / Territory) • North America (Continent) • United States of America (Country)

Spatial Coverage

min long: -87.635; min lat: 24.396 ; max long: -79.974; max lat: 31.001 ;

Record Identifiers

NADB document id number(s): 359400

NADB citation id number(s): 000000054143