The use of Scanning Electron Microscopes and X-ray Spectrometers for the Identification of Hafting Traces and other Residues
Author(s): Alfred F Pawlik
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Cite this Record
The use of Scanning Electron Microscopes and X-ray Spectrometers for the Identification of Hafting Traces and other Residues. Alfred F Pawlik, E A Walker, F Wenban-Smith, F Healy. In The Recent Archaeological Approaches to the Use-Wear Analysis and Technical process. Proceedings of the international conference dedicated to the 100th anniversary of Sergey Aristarhovitch Semenov, 30 january-5 february 2000 in Saint-Petersburg. Pp. xx-xx. 2003 ( tDAR id: 418881)
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ExArc Id(s): 5136
Rights & Attribution: The information in this record was originally compiled by Dr. Roeland Paardekooper, EXARC Director.